Detecting suicide risk in bipolar disorder patients from lymphoblastoid cell lines genetic signatures.
Saved in:
| Title: | Detecting suicide risk in bipolar disorder patients from lymphoblastoid cell lines genetic signatures. |
|---|---|
| Authors: | Sharma O; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Nayak R; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Mizrahi L; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Rike WA; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Choudhary A; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Sadis H; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Hussein Y; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Rosh I; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Tripathi U; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Shemen A; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Stern Y; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel., Squassina A; Department of Biomedical Sciences, University of Cagliari, Cagliari, Italy. squassina@unica.it., Alda M; Department of Psychiatry, Dalhousie University, Halifax, NS, Canada. malda@dal.ca.; National Institute of Mental Health, Klecany, Czech Republic. malda@dal.ca., Stern S; Sagol Department of Neurobiology, University of Haifa, Haifa, Israel. sstern@univ.haifa.ac.il. |
| Source: | Translational psychiatry [Transl Psychiatry] 2025 Sep 03; Vol. 15 (1), pp. 339. Date of Electronic Publication: 2025 Sep 03. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Nature Pub. Group Country of Publication: United States NLM ID: 101562664 Publication Model: Electronic Cited Medium: Internet ISSN: 2158-3188 (Electronic) Linking ISSN: 21583188 NLM ISO Abbreviation: Transl Psychiatry Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!
