A Low-Background, High-Flatness Mounting Method for In Situ SIMS Isotopic Analysis for Fine-Grained Samples.

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Title: A Low-Background, High-Flatness Mounting Method for In Situ SIMS Isotopic Analysis for Fine-Grained Samples.
Authors: Gao YB; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.; College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China., Hao JL; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China., Zhou Z; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.; College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China., He HC; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China., Tang GQ; State Key Laboratory of Lithospheric and Environmental Coevolution, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China., Hu S; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China., Yang W; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China., Lin YT; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.
Source: Analytical chemistry [Anal Chem] 2025 Oct 07; Vol. 97 (39), pp. 21200-21204. Date of Electronic Publication: 2025 Sep 15.
Publication Type: Journal Article
Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 0370536 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1520-6882 (Electronic) Linking ISSN: 00032700 NLM ISO Abbreviation: Anal Chem Subsets: MEDLINE; PubMed not MEDLINE
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  Data: A Low-Background, High-Flatness Mounting Method for In Situ SIMS Isotopic Analysis for Fine-Grained Samples.
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  Data: <searchLink fieldCode="AU" term="%22Gao+YB%22">Gao YB</searchLink>; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.; College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China.<br /><searchLink fieldCode="AU" term="%22Hao+JL%22">Hao JL</searchLink>; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.<br /><searchLink fieldCode="AU" term="%22Zhou+Z%22">Zhou Z</searchLink>; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.; College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China.<br /><searchLink fieldCode="AU" term="%22He+HC%22">He HC</searchLink>; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.<br /><searchLink fieldCode="AU" term="%22Tang+GQ%22">Tang GQ</searchLink>; State Key Laboratory of Lithospheric and Environmental Coevolution, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.<br /><searchLink fieldCode="AU" term="%22Hu+S%22">Hu S</searchLink>; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.<br /><searchLink fieldCode="AU" term="%22Yang+W%22">Yang W</searchLink>; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.<br /><searchLink fieldCode="AU" term="%22Lin+YT%22">Lin YT</searchLink>; Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China.
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  Data: <searchLink fieldCode="JN" term="%220370536%22">Analytical chemistry</searchLink> [Anal Chem] 2025 Oct 07; Vol. 97 (39), pp. 21200-21204. <i>Date of Electronic Publication: </i>2025 Sep 15.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22American+Chemical+Society%22">American Chemical Society </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>0370536 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1520-6882 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2200032700%22">00032700 </searchLink><i>NLM ISO Abbreviation: </i>Anal Chem <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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      – Type: doi
        Value: 10.1021/acs.analchem.5c04185
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      – Code: eng
        Text: English
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        StartPage: 21200
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      – TitleFull: A Low-Background, High-Flatness Mounting Method for In Situ SIMS Isotopic Analysis for Fine-Grained Samples.
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            NameFull: Gao YB
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            NameFull: Hao JL
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            NameFull: Zhou Z
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            – D: 07
              M: 10
              Text: 2025 Oct 07
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              Y: 2025
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              Value: 1520-6882
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              Value: 97
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              Value: 39
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            – TitleFull: Analytical chemistry
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