Depth Correction of TOF-SIMS Depth Profiling Images Using the Total Ion Count Images.
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| Title: | Depth Correction of TOF-SIMS Depth Profiling Images Using the Total Ion Count Images. |
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| Authors: | Brunet MA; Department of Chemical and Biomolecular Engineering, University of Illinois Urbana-Champaign, Champaign, IL 61801, USA., Gorman BL; Center for Biophysics and Quantitative Biology, University of Illinois Urbana-Champaign, Champaign, IL 61801, USA., Kraft ML; Department of Chemical and Biomolecular Engineering, University of Illinois Urbana-Champaign, Champaign, IL 61801, USA.; Center for Biophysics and Quantitative Biology, University of Illinois Urbana-Champaign, Champaign, IL 61801, USA. |
| Source: | Biomolecules [Biomolecules] 2025 Aug 27; Vol. 15 (9). Date of Electronic Publication: 2025 Aug 27. |
| Publication Type: | Journal Article; Research Support, Non-U.S. Gov't; Research Support, N.I.H., Extramural |
| Journal Info: | Publisher: MDPI Country of Publication: Switzerland NLM ID: 101596414 Publication Model: Electronic Cited Medium: Internet ISSN: 2218-273X (Electronic) Linking ISSN: 2218273X NLM ISO Abbreviation: Biomolecules Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
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