Neural spike compression through salient sample extraction and curve fitting dedicated to high-density brain implants.
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| Title: | Neural spike compression through salient sample extraction and curve fitting dedicated to high-density brain implants. |
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| Authors: | Nekoui M; Integrated Electronics (INTELECT) Laboratory, EECS Department, York University, Toronto, Canada., Sodagar AM; Integrated Electronics (INTELECT) Laboratory, EECS Department, York University, Toronto, Canada. sodagar@yorku.ca. |
| Source: | Communications engineering [Commun Eng] 2025 Sep 29; Vol. 4 (1), pp. 171. Date of Electronic Publication: 2025 Sep 29. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Springer Nature Country of Publication: England NLM ID: 9918523382506676 Publication Model: Electronic Cited Medium: Internet ISSN: 2731-3395 (Electronic) Linking ISSN: 27313395 NLM ISO Abbreviation: Commun Eng Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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