APA (7th ed.) Citation

A, A., S, S., AX, d. S., DK, T., JY, M., GN, J., . . . NP, L. (2025). Resolving agrochemical penetration in wheat leaves with secondary ion mass spectrometry imaging and depth profiling. Analytical and bioanalytical chemistry, 417(28), 6427. https://doi.org/10.1007/s00216-025-06134-1

Chicago Style (17th ed.) Citation

A, Ajith, Sheraz S, de Souza AX, Trivedi DK, Mugnier JY, Johnson GN, Milnes PJ, and Lockyer NP. "Resolving Agrochemical Penetration in Wheat Leaves with Secondary Ion Mass Spectrometry Imaging and Depth Profiling." Analytical and Bioanalytical Chemistry 417, no. 28 (2025): 6427. https://doi.org/10.1007/s00216-025-06134-1.

MLA (9th ed.) Citation

A, Ajith, et al. "Resolving Agrochemical Penetration in Wheat Leaves with Secondary Ion Mass Spectrometry Imaging and Depth Profiling." Analytical and Bioanalytical Chemistry, vol. 417, no. 28, 2025, p. 6427, https://doi.org/10.1007/s00216-025-06134-1.