APA (7th ed.) Citation

A, J., C, B., M, L., ZV, P., S, P., & CA, W. (2025). Efficient finetuning of foundation model combined with few-shot learning improves pattern recognition in histopathology. Virchows Archiv : an international journal of pathology. https://doi.org/10.1007/s00428-025-04351-8

Chicago Style (17th ed.) Citation

A, Jessen, Blattgerste C, Legnar M, Popovic ZV, Porubsky S, and Weis CA. "Efficient Finetuning of Foundation Model Combined with Few-shot Learning Improves Pattern Recognition in Histopathology." Virchows Archiv : An International Journal of Pathology 2025. https://doi.org/10.1007/s00428-025-04351-8.

MLA (9th ed.) Citation

A, Jessen, et al. "Efficient Finetuning of Foundation Model Combined with Few-shot Learning Improves Pattern Recognition in Histopathology." Virchows Archiv : An International Journal of Pathology, 2025, https://doi.org/10.1007/s00428-025-04351-8.