APA (7th ed.) Citation

Shi, Y., Alfouneh, M., & Yuan, C. (2025). Sequential topology optimization and reliability analysis using bisection: Level-set vs MIST, SIMP and ESO methods with multi-source uncertainties. AIMS Mathematics, 10(6), 1. https://doi.org/10.3934/math.2025648

Chicago Style (17th ed.) Citation

Shi, Yiqing, Mahmoud Alfouneh, and Chao Yuan. "Sequential Topology Optimization and Reliability Analysis Using Bisection: Level-set Vs MIST, SIMP and ESO Methods with Multi-source Uncertainties." AIMS Mathematics 10, no. 6 (2025): 1. https://doi.org/10.3934/math.2025648.

MLA (9th ed.) Citation

Shi, Yiqing, et al. "Sequential Topology Optimization and Reliability Analysis Using Bisection: Level-set Vs MIST, SIMP and ESO Methods with Multi-source Uncertainties." AIMS Mathematics, vol. 10, no. 6, 2025, p. 1, https://doi.org/10.3934/math.2025648.