Sequential topology optimization and reliability analysis using bisection: Level-set vs MIST, SIMP and ESO methods with multi-source uncertainties.
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| Title: | Sequential topology optimization and reliability analysis using bisection: Level-set vs MIST, SIMP and ESO methods with multi-source uncertainties. |
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| Authors: | Shi, Yiqing1 (AUTHOR), Alfouneh, Mahmoud2 (AUTHOR) alfoone@uoz.ac.ir, Yuan, Chao1,3 (AUTHOR) yc13718047495@163.com |
| Source: | AIMS Mathematics. 2025, Vol. 10 Issue 6, p1-42. 42p. |
| Database: | Mathematics Source |
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