Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra
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| Title: | Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra |
|---|---|
| Description: | This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students. |
| Authors: | Anton I. Mikhailov, Author, Igor F. Mikhailov, Author, Alexey A. Baturin , Author |
| Resource Type: | eBook. |
| Subjects: | X-rays--Diffraction, Materials--Analysis, Fluorescence spectroscopy, X-ray spectroscopy |
| Categories: | SCIENCE / Physics / Electromagnetism, SCIENCE / Radiation, TECHNOLOGY & ENGINEERING / Materials Science / Thin Films, Surfaces & Interfaces |
| Database: | eBook Collection (EBSCOhost) |
| FullText | Links: – Type: ebook-pdf Text: Availability: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra – Name: Abstract Label: Description Group: Ab Data: This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Anton+I%2E+Mikhailov%2C+Author%22">Anton I. Mikhailov, Author</searchLink><br /><searchLink fieldCode="AR" term="%22Igor+F%2E+Mikhailov%2C+Author%22">Igor F. Mikhailov, Author</searchLink><br /><searchLink fieldCode="AR" term="%22Alexey+A%2E+Baturin+%2C+Author%22">Alexey A. Baturin , Author</searchLink> – Name: TypePub Label: Resource Type Group: TypPub Data: eBook. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22X-rays--Diffraction%22">X-rays--Diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Materials--Analysis%22">Materials--Analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Fluorescence+spectroscopy%22">Fluorescence spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+spectroscopy%22">X-ray spectroscopy</searchLink> – Name: SubjectBISAC Label: Categories Group: Su Data: <searchLink fieldCode="ZK" term="%22SCIENCE+%2F+Physics+%2F+Electromagnetism%22">SCIENCE / Physics / Electromagnetism</searchLink><br /><searchLink fieldCode="ZK" term="%22SCIENCE+%2F+Radiation%22">SCIENCE / Radiation</searchLink><br /><searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+Materials+Science+%2F+Thin+Films%2C+Surfaces+%26+Interfaces%22">TECHNOLOGY & ENGINEERING / Materials Science / Thin Films, Surfaces & Interfaces</searchLink> |
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| RecordInfo | BibRecord: BibEntity: Classifications: – Code: 543.56 Scheme: ddc Type: prePub Languages: – Code: eng Text: English Subjects: – SubjectFull: X-rays--Diffraction Type: general – SubjectFull: Materials--Analysis Type: general – SubjectFull: Fluorescence spectroscopy Type: general – SubjectFull: X-ray spectroscopy Type: general Titles: – TitleFull: Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Anton I. Mikhailov, Author – PersonEntity: Name: NameFull: Igor F. Mikhailov, Author – PersonEntity: Name: NameFull: Alexey A. Baturin , Author – PersonEntity: Name: NameFull: Anton I. Mikhailov, Author – PersonEntity: Name: NameFull: Igor F. Mikhailov, Author – PersonEntity: Name: NameFull: Alexey A. Baturin , Author IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Type: published Y: 2020 – D: 25 M: 02 Type: profile Y: 2020 Identifiers: – Type: isbn-print Value: 9781527542464 – Type: isbn-electronic Value: 9781527543898 Titles: – TitleFull: Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra Type: main |
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