Measurement Technology and Engineering Researches in Industry
Saved in:
| Title: | Measurement Technology and Engineering Researches in Industry |
|---|---|
| Description: | Selected, peer reviewed papers from the 2013 2nd International Conference on Measurement, Instrumentation and Automation (ICMIA 2013), April 23-24, 2013, Guilin, China |
| Authors: | Prasad Yarlagadda, Yun Hae Kim |
| Resource Type: | eBook. |
| Subjects: | Electronic measurements--Congresses, Automation--Congresses |
| Categories: | TECHNOLOGY & ENGINEERING / General |
| Database: | eBook Collection (EBSCOhost) |
| FullText | Links: – Type: ebook-pdf Text: Availability: 0 |
|---|---|
| Header | DbId: nlebk DbLabel: eBook Collection (EBSCOhost) An: 646128 RelevancyScore: 1051 AccessLevel: 6 PubType: eBook PubTypeId: ebook PreciseRelevancyScore: 1050.81640625 |
| IllustrationInfo | |
| ImageInfo | – Size: thumb Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$646128$PDF&s=r – Size: medium Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$646128$PDF&s=d |
| Items | – Name: Title Label: Title Group: Ti Data: Measurement Technology and Engineering Researches in Industry – Name: Abstract Label: Description Group: Ab Data: Selected, peer reviewed papers from the 2013 2nd International Conference on Measurement, Instrumentation and Automation (ICMIA 2013), April 23-24, 2013, Guilin, China – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Prasad+Yarlagadda%22">Prasad Yarlagadda</searchLink><br /><searchLink fieldCode="AR" term="%22Yun+Hae+Kim%22">Yun Hae Kim</searchLink> – Name: TypePub Label: Resource Type Group: TypPub Data: eBook. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Electronic+measurements--Congresses%22">Electronic measurements--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Automation--Congresses%22">Automation--Congresses</searchLink> – Name: SubjectBISAC Label: Categories Group: Su Data: <searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+General%22">TECHNOLOGY & ENGINEERING / General</searchLink> |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=nlebk&AN=646128 |
| RecordInfo | BibRecord: BibEntity: Classifications: – Code: 620.110287 Scheme: ddc Type: prePub Languages: – Code: eng Text: English Subjects: – SubjectFull: Electronic measurements--Congresses Type: general – SubjectFull: Automation--Congresses Type: general Titles: – TitleFull: Measurement Technology and Engineering Researches in Industry Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Prasad Yarlagadda – PersonEntity: Name: NameFull: Yun Hae Kim – PersonEntity: Name: NameFull: Prasad Yarlagadda – PersonEntity: Name: NameFull: Yun Hae Kim IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Type: published Y: 2013 – D: 18 M: 06 Type: profile Y: 2014 Identifiers: – Type: isbn-print Value: 9783037857502 – Type: isbn-electronic Value: 9783038261315 Numbering: – Type: volume Value: 00333 Titles: – TitleFull: Measurement Technology and Engineering Researches in Industry Type: main |
| ResultId | 1 |