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Sensors, Measurement and Intelligent Materials II

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Title: Sensors, Measurement and Intelligent Materials II
Description: Selected, peer reviewed papers from the 2013 2nd International Conference on Sensors, Measurement and lntellligent Materials (ICSMIM 2013), November 16-17, 2013, Guangzhou, China
Authors: Yun Hae Kim, Prasad Yarlagadda
Resource Type: eBook.
Subjects: Measurement--Congresses, Smart materials--Congresses, Detectors--Congresses
Categories: TECHNOLOGY & ENGINEERING / General
Database: eBook Collection (EBSCOhost)
FullText Links:
  – Type: ebook-pdf
Text:
  Availability: 0
Header DbId: nlebk
DbLabel: eBook Collection (EBSCOhost)
An: 681279
RelevancyScore: 1057
AccessLevel: 6
PubType: eBook
PubTypeId: ebook
PreciseRelevancyScore: 1057.36352539063
IllustrationInfo
ImageInfo – Size: thumb
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$681279$PDF&s=r
– Size: medium
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$681279$PDF&s=d
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Sensors, Measurement and Intelligent Materials II
– Name: Abstract
  Label: Description
  Group: Ab
  Data: Selected, peer reviewed papers from the 2013 2nd International Conference on Sensors, Measurement and lntellligent Materials (ICSMIM 2013), November 16-17, 2013, Guangzhou, China
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Yun+Hae+Kim%22">Yun Hae Kim</searchLink><br /><searchLink fieldCode="AR" term="%22Prasad+Yarlagadda%22">Prasad Yarlagadda</searchLink>
– Name: TypePub
  Label: Resource Type
  Group: TypPub
  Data: eBook.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Measurement--Congresses%22">Measurement--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Smart+materials--Congresses%22">Smart materials--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Detectors--Congresses%22">Detectors--Congresses</searchLink>
– Name: SubjectBISAC
  Label: Categories
  Group: Su
  Data: <searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+General%22">TECHNOLOGY & ENGINEERING / General</searchLink>
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=nlebk&AN=681279
RecordInfo BibRecord:
  BibEntity:
    Classifications:
      – Code: 620.11
        Scheme: ddc
        Type: prePub
    Languages:
      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: Measurement--Congresses
        Type: general
      – SubjectFull: Smart materials--Congresses
        Type: general
      – SubjectFull: Detectors--Congresses
        Type: general
    Titles:
      – TitleFull: Sensors, Measurement and Intelligent Materials II
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Yun Hae Kim
      – PersonEntity:
          Name:
            NameFull: Prasad Yarlagadda
      – PersonEntity:
          Name:
            NameFull: Yun Hae Kim
      – PersonEntity:
          Name:
            NameFull: Prasad Yarlagadda
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 2014
            – D: 24
              M: 04
              Type: profile
              Y: 2014
          Identifiers:
            – Type: isbn-print
              Value: 9783037859711
            – Type: isbn-electronic
              Value: 9783038263524
          Numbering:
            – Type: volume
              Value: 00475
          Titles:
            – TitleFull: Sensors, Measurement and Intelligent Materials II
              Type: main
ResultId 1