Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /

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Bibliographic Details
Main Author:	Echlin, Patrick
Format:	Book
Language:	English
Published:	Cambridge : Springer, 2009.
Subjects:	Microscopía electrónica Microanálisis
Notas Contenido:	Introduction Sample collection and selection Sample preparation tools sample support Sample Embedding and mounting Sample exposure Sample dehydration Sample stabilization for imaging in the SEM Sample Stabilization to preserve chemical identity Sample cleaning Sample surface charge elimination Sample artifacts and damage Additional sources in information

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Holdings details from Valle/Astin: Unknown
Call Number:	502.825 E18h
Copy Ej. 1	Available Place a Hold