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Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /

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Bibliographic Details
Main Author: Echlin, Patrick
Format: Book
Language: English
Published: Cambridge : Springer, 2009.
Subjects:
Microscopía electrónica
Microanálisis
Notas Contenido:
  • Introduction
  • Sample collection and selection
  • Sample preparation tools
  • sample support
  • Sample Embedding and mounting
  • Sample exposure
  • Sample dehydration
  • Sample stabilization for imaging in the SEM
  • Sample Stabilization to preserve chemical identity
  • Sample cleaning
  • Sample surface charge elimination
  • Sample artifacts and damage
  • Additional sources in information
Description
Physical Description:330 páginas : ilustraciones ; 24 cm.
Bibliography:Incluye bibliografía e índice
ISBN:9780387857305

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