Multi-Layer Dependability: From Microarchitecture to Application Level.
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| Title: | Multi-Layer Dependability: From Microarchitecture to Application Level. |
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| Authors: | Henkel, Jörg1, henkel@kit.edu, Bauer, Lars1, lars.bauer@kit.edu, Hongyan Zhang1, hongyan.zhang@kit.edu, Semeen Rehman1, semeen.rehman@kit.edu, Shafique, Muhammad1, muhammad.shafique@kit.edu |
| Source: | DAC: Annual ACM/IEEE Design Automation Conference; 2014, p263-268, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0738100X |
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| DOI: | 10.1145/2593069.2596683 |
