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Multi-Layer Dependability: From Microarchitecture to Application Level.

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Title: Multi-Layer Dependability: From Microarchitecture to Application Level.
Authors: Henkel, Jörg1, henkel@kit.edu, Bauer, Lars1, lars.bauer@kit.edu, Hongyan Zhang1, hongyan.zhang@kit.edu, Semeen Rehman1, semeen.rehman@kit.edu, Shafique, Muhammad1, muhammad.shafique@kit.edu
Source: DAC: Annual ACM/IEEE Design Automation Conference; 2014, p263-268, 6p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Conference
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        Value: 10.1145/2593069.2596683
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        Text: English
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        PageCount: 6
        StartPage: 263
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      – TitleFull: Multi-Layer Dependability: From Microarchitecture to Application Level.
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            NameFull: Bauer, Lars
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              Text: 2014
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              Value: 0738100X
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            – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference
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