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Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging.

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Bibliographic Details
Title:	Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging.
Authors:	Yazdanbakhsh, Amir¹, Balasubramanian, Raghuraman², Nowatzki, Tony², Sankaralingam, Karthikeyan²
Source:	IEEE Micro; Nov2015, Vol. 35 Issue 6, p24-36, 13p
Database:	Applied Science & Technology Source

Description
ISSN:	02721732
DOI:	10.1109/MM.2015.136