APA (7th ed.) Citation

Yazdanbakhsh, A., Balasubramanian, R., Nowatzki, T., & Sankaralingam, K. (2015). Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging. IEEE Micro, 35(6), 24. https://doi.org/10.1109/MM.2015.136

Chicago Style (17th ed.) Citation

Yazdanbakhsh, Amir, Raghuraman Balasubramanian, Tony Nowatzki, and Karthikeyan Sankaralingam. "Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging." IEEE Micro 35, no. 6 (2015): 24. https://doi.org/10.1109/MM.2015.136.

MLA (9th ed.) Citation

Yazdanbakhsh, Amir, et al. "Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging." IEEE Micro, vol. 35, no. 6, 2015, p. 24, https://doi.org/10.1109/MM.2015.136.