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Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging.

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Bibliographic Details
Title: Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging.
Authors: Yazdanbakhsh, Amir1, Balasubramanian, Raghuraman2, Nowatzki, Tony2, Sankaralingam, Karthikeyan2
Source: IEEE Micro; Nov2015, Vol. 35 Issue 6, p24-36, 13p
Database: Applied Science & Technology Source
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