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MICROSTRUCTURAL OBSERVATION OF INTERFACES IN DIFFUSION BONDED SILICON CARBIDE CERAMICS BY TEM.

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Bibliographic Details
Title: MICROSTRUCTURAL OBSERVATION OF INTERFACES IN DIFFUSION BONDED SILICON CARBIDE CERAMICS BY TEM.
Authors: Tsuda, H.1, Mori, S.1, Halbig, M. C.2, Singh, M.3, Asthana, R.4
Source: Ceramic Engineering & Science Proceedings; 2015, Vol. 36 Issue 6, p13-20, 8p
Database: Applied Science & Technology Source
Description
ISSN:01966219