Fujiwara, S., Harada, M., & Fujita, Y. (2016). Interconnection reliability and interfacial structure between Au alloy bump and Al pad using ultrasonic bonding. Welding International, 30(9), 653. https://doi.org/10.1080/09507116.2016.1142186
Chicago Style (17th ed.) CitationFujiwara, Shinichi, Masahide Harada, and Yuji Fujita. "Interconnection Reliability and Interfacial Structure Between Au Alloy Bump and Al Pad Using Ultrasonic Bonding." Welding International 30, no. 9 (2016): 653. https://doi.org/10.1080/09507116.2016.1142186.
MLA (9th ed.) CitationFujiwara, Shinichi, et al. "Interconnection Reliability and Interfacial Structure Between Au Alloy Bump and Al Pad Using Ultrasonic Bonding." Welding International, vol. 30, no. 9, 2016, p. 653, https://doi.org/10.1080/09507116.2016.1142186.