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A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs.

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Bibliographic Details
Title:	A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs.
Authors:	Li, Tianjian¹, Xie, Feng¹, Liang, Xiaoyao¹, Xu, Qiang², Chakrabarty, Krishnendu³, Jing, Naifeng¹, Jiang, Li¹
Source:	IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Jul2016, Vol. 35 Issue 7, p1192-1205, 14p
Database:	Applied Science & Technology Source

Description
ISSN:	02780070
DOI:	10.1109/TCAD.2015.2512909