APA (7th ed.) Citation

Li, T., Xie, F., Liang, X., Xu, Q., Chakrabarty, K., Jing, N., & Jiang, L. (2016). A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 35(7), 1192. https://doi.org/10.1109/TCAD.2015.2512909

Chicago Style (17th ed.) Citation

Li, Tianjian, Feng Xie, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty, Naifeng Jing, and Li Jiang. "A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 35, no. 7 (2016): 1192. https://doi.org/10.1109/TCAD.2015.2512909.

MLA (9th ed.) Citation

Li, Tianjian, et al. "A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 35, no. 7, 2016, p. 1192, https://doi.org/10.1109/TCAD.2015.2512909.