Bibliographic Details
| Title: |
High reflectance dielectric distributed Bragg reflectors for near ultra-violet planar microcavities: SiO2/HfO2 versus SiO2/SiNx. |
| Authors: |
Réveret, F.1,2, francois.reveret@univ-bpclermont.fr, Bignet, L.1,2, Zhigang, W.1,2, Lafosse, X.3, Patriarche, G.3, Disseix, P.1,2, Médard, F.1,2, Mihailovic, M.1,2, Leymarie, J.1,2, Zúñiga-Pérez, J.4, Bouchoule, S.3 |
| Source: |
Journal of Applied Physics; 9/7/2016, Vol. 120 Issue 9, p1-10, 10p, 3 Charts, 10 Graphs |
| Database: |
Applied Science & Technology Source |