APA (7th ed.) Citation

Réveret, F., Bignet, L., Zhigang, W., Lafosse, X., Patriarche, G., Disseix, P., . . . Bouchoule, S. (2016). High reflectance dielectric distributed Bragg reflectors for near ultra-violet planar microcavities: SiO2/HfO2 versus SiO2/SiNx. Journal of Applied Physics, 120(9), 1. https://doi.org/10.1063/1.4961658

Chicago Style (17th ed.) Citation

Réveret, F., et al. "High Reflectance Dielectric Distributed Bragg Reflectors for Near Ultra-violet Planar Microcavities: SiO2/HfO2 Versus SiO2/SiNx." Journal of Applied Physics 120, no. 9 (2016): 1. https://doi.org/10.1063/1.4961658.

MLA (9th ed.) Citation

Réveret, F., et al. "High Reflectance Dielectric Distributed Bragg Reflectors for Near Ultra-violet Planar Microcavities: SiO2/HfO2 Versus SiO2/SiNx." Journal of Applied Physics, vol. 120, no. 9, 2016, p. 1, https://doi.org/10.1063/1.4961658.