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High reflectance dielectric distributed Bragg reflectors for near ultra-violet planar microcavities: SiO2/HfO2 versus SiO2/SiNx.

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Title: High reflectance dielectric distributed Bragg reflectors for near ultra-violet planar microcavities: SiO2/HfO2 versus SiO2/SiNx.
Authors: Réveret, F.1,2, francois.reveret@univ-bpclermont.fr, Bignet, L.1,2, Zhigang, W.1,2, Lafosse, X.3, Patriarche, G.3, Disseix, P.1,2, Médard, F.1,2, Mihailovic, M.1,2, Leymarie, J.1,2, Zúñiga-Pérez, J.4, Bouchoule, S.3
Source: Journal of Applied Physics; 9/7/2016, Vol. 120 Issue 9, p1-10, 10p, 3 Charts, 10 Graphs
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 117943856
AccessLevel: 2
PubType: Academic Journal
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              Text: 9/7/2016
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