Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.
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| Title: | Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces. |
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| Authors: | Gleichner, Christian1, Vierhaus, Heinrich T.1 |
| Source: | Journal of Circuits, Systems & Computers; Aug2017, Vol. 26 Issue 8, p-1, 17p |
| Database: | Applied Science & Technology Source |
| ISSN: | 02181266 |
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| DOI: | 10.1142/S0218126617400060 |
