APA (7th ed.) Citation

Gleichner, C., & Vierhaus, H. T. (2017). Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces. Journal of Circuits, Systems & Computers, 26(8), -1. https://doi.org/10.1142/S0218126617400060

Chicago Style (17th ed.) Citation

Gleichner, Christian, and Heinrich T. Vierhaus. "Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces." Journal of Circuits, Systems & Computers 26, no. 8 (2017): -1. https://doi.org/10.1142/S0218126617400060.

MLA (9th ed.) Citation

Gleichner, Christian, and Heinrich T. Vierhaus. "Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces." Journal of Circuits, Systems & Computers, vol. 26, no. 8, 2017, pp. -1, https://doi.org/10.1142/S0218126617400060.