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Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.

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Bibliographic Details
Title: Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.
Authors: Gleichner, Christian1, Vierhaus, Heinrich T.1
Source: Journal of Circuits, Systems & Computers; Aug2017, Vol. 26 Issue 8, p-1, 17p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 122401348
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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        Value: 10.1142/S0218126617400060
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      – Code: eng
        Text: English
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        PageCount: 17
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      – TitleFull: Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.
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              Text: Aug2017
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