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Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.

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Bibliographic Details
Title: Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.
Authors: Gleichner, Christian1, Vierhaus, Heinrich T.1
Source: Journal of Circuits, Systems & Computers; Aug2017, Vol. 26 Issue 8, p-1, 17p
Database: Applied Science & Technology Source
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