Supporting Unit Test Generation via Automated Isolation.

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Bibliographic Details
Title:	Supporting Unit Test Generation via Automated Isolation.
Authors:	Honfi, Dávid^1,2, honfi@mit.bme.hu, Micskei, Zoltán¹
Source:	Periodica Polytechnica: Electrical Engineering & Computer Science; 2017, Vol. 61 Issue 2, p116-131, 16p
Database:	Applied Science & Technology Source

Description
ISSN:	20645260
DOI:	10.3311/PPee.9768