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Supporting Unit Test Generation via Automated Isolation.

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Bibliographic Details
Title: Supporting Unit Test Generation via Automated Isolation.
Authors: Honfi, Dávid1,2, honfi@mit.bme.hu, Micskei, Zoltán1
Source: Periodica Polytechnica: Electrical Engineering & Computer Science; 2017, Vol. 61 Issue 2, p116-131, 16p
Database: Applied Science & Technology Source
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        Value: 10.3311/PPee.9768
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        Text: English
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