Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers.
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| Title: | Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers. |
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| Authors: | Tuccitto, Nunzio1, n.tuccitto@unict.it, Bombace, Alessandra1, Torrisi, Alberto1, Licciardello, Antonino1 |
| Source: | Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; May2018, Vol. 36 Issue 3, pN.PAG-N.PAG, 4p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 129768925 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Tuccitto%2C+Nunzio%22">Tuccitto, Nunzio</searchLink><relatesTo>1</relatesTo>, <i>n.tuccitto@unict.it</i><br /><searchLink fieldCode="AU" term="%22Bombace%2C+Alessandra%22">Bombace, Alessandra</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Torrisi%2C+Alberto%22">Torrisi, Alberto</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Licciardello%2C+Antonino%22">Licciardello, Antonino</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Vacuum+Science+%26+Technology%3A+Part+B-Nanotechnology+%26+Microelectronics%22">Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics</searchLink>; May2018, Vol. 36 Issue 3, pN.PAG-N.PAG, 4p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=129768925 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1116/1.5019698 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: N.PAG Titles: – TitleFull: Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Tuccitto, Nunzio – PersonEntity: Name: NameFull: Bombace, Alessandra – PersonEntity: Name: NameFull: Torrisi, Alberto – PersonEntity: Name: NameFull: Licciardello, Antonino IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2018 Type: published Y: 2018 Identifiers: – Type: issn-print Value: 21662746 Numbering: – Type: volume Value: 36 – Type: issue Value: 3 Titles: – TitleFull: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics Type: main |
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