Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias.
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| Title: | Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias. |
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| Authors: | Tanaka, Chika1, chika.tanaka@kioxia.com, Adachi, Kanna2, Nakayama, Atsushi3, Iguchi, Yasuhiko1, Yoshitomi, Sadayuki1 |
| Source: | IEEE Transactions on Semiconductor Manufacturing; May2020, Vol. 33 Issue 2, p146-149, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 08946507 |
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| DOI: | 10.1109/TSM.2020.2983977 |
