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Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias.

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Title: Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias.
Authors: Tanaka, Chika1, chika.tanaka@kioxia.com, Adachi, Kanna2, Nakayama, Atsushi3, Iguchi, Yasuhiko1, Yoshitomi, Sadayuki1
Source: IEEE Transactions on Semiconductor Manufacturing; May2020, Vol. 33 Issue 2, p146-149, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 143174178
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias.
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  Data: <searchLink fieldCode="AU" term="%22Tanaka%2C+Chika%22">Tanaka, Chika</searchLink><relatesTo>1</relatesTo>, <i>chika.tanaka@kioxia.com</i><br /><searchLink fieldCode="AU" term="%22Adachi%2C+Kanna%22">Adachi, Kanna</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Nakayama%2C+Atsushi%22">Nakayama, Atsushi</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Iguchi%2C+Yasuhiko%22">Iguchi, Yasuhiko</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yoshitomi%2C+Sadayuki%22">Yoshitomi, Sadayuki</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Semiconductor+Manufacturing%22">IEEE Transactions on Semiconductor Manufacturing</searchLink>; May2020, Vol. 33 Issue 2, p146-149, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=143174178
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        Value: 10.1109/TSM.2020.2983977
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      – Code: eng
        Text: English
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      – TitleFull: Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias.
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              Text: May2020
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