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Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias.

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Bibliographic Details
Title: Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias.
Authors: Tanaka, Chika1, chika.tanaka@kioxia.com, Adachi, Kanna2, Nakayama, Atsushi3, Iguchi, Yasuhiko1, Yoshitomi, Sadayuki1
Source: IEEE Transactions on Semiconductor Manufacturing; May2020, Vol. 33 Issue 2, p146-149, 4p
Database: Applied Science & Technology Source
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