Bibliographic Details
| Title: |
Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process. |
| Authors: |
Hung, Wei-Chun1, Jin, Fu-Yuan1, Chang, Ting-Chang1, tcchang3708@gmail.com, Ciou, Fong-Min1, Chang, Chin-Han2, Lin, Chien-Yu3, Lin, Yu Shan1, Chang, Kai-Chun1, Chang, Yen-Cheng1, Lin, Yun-Hsuan1, Yeh, Chien-Hung3, Kuo, Ting Tzu2, Chen, Kuan-Hsu1 |
| Source: |
IEEE Electron Device Letters; Oct2020, Vol. 41 Issue 10, p1540-1543, 4p |
| Database: |
Applied Science & Technology Source |