APA (7th ed.) Citation

Hung, W., Jin, F., Chang, T., Ciou, F., Chang, C., Lin, C., . . . Chen, K. (2020). Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process. IEEE Electron Device Letters, 41(10), 1540. https://doi.org/10.1109/LED.2020.3015287

Chicago Style (17th ed.) Citation

Hung, Wei-Chun, et al. "Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process." IEEE Electron Device Letters 41, no. 10 (2020): 1540. https://doi.org/10.1109/LED.2020.3015287.

MLA (9th ed.) Citation

Hung, Wei-Chun, et al. "Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process." IEEE Electron Device Letters, vol. 41, no. 10, 2020, p. 1540, https://doi.org/10.1109/LED.2020.3015287.