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Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process.

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Title: Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process.
Authors: Hung, Wei-Chun1, Jin, Fu-Yuan1, Chang, Ting-Chang1, tcchang3708@gmail.com, Ciou, Fong-Min1, Chang, Chin-Han2, Lin, Chien-Yu3, Lin, Yu Shan1, Chang, Kai-Chun1, Chang, Yen-Cheng1, Lin, Yun-Hsuan1, Yeh, Chien-Hung3, Kuo, Ting Tzu2, Chen, Kuan-Hsu1
Source: IEEE Electron Device Letters; Oct2020, Vol. 41 Issue 10, p1540-1543, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 146170435
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Electron+Device+Letters%22">IEEE Electron Device Letters</searchLink>; Oct2020, Vol. 41 Issue 10, p1540-1543, 4p
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        Value: 10.1109/LED.2020.3015287
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              Text: Oct2020
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              Y: 2020
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