Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces.
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| Title: | Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces. |
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| Authors: | Le, Phuong Y.1, phuong.leyen@rmit.edu.au, Gazzana, Amanda1, s3721457@student.rmit.edu.au, Murdoch, Billy J.2, billy.murdoch@rmit.edu.au, McCulloch, Dougal G.3, david.mckenzie@sydney.edu.au, McKenzie, David R.1, dougal.mcculloch@rmit.edu.au, Tran, Hiep N.4, hiep.tranlengoc@rmit.edu.au, Partridge, Jim G.1, james.partridge@rmit.edu.au |
| Source: | IEEE Transactions on Electron Devices; Feb2021, Vol. 68 Issue 2, p720-725, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189383 |
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| DOI: | 10.1109/TED.2020.3044021 |
