APA (7th ed.) Citation

Le, P. Y., Gazzana, A., Murdoch, B. J., McCulloch, D. G., McKenzie, D. R., Tran, H. N., & Partridge, J. G. (2021). Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces. IEEE Transactions on Electron Devices, 68(2), 720. https://doi.org/10.1109/TED.2020.3044021

Chicago Style (17th ed.) Citation

Le, Phuong Y., Amanda Gazzana, Billy J. Murdoch, Dougal G. McCulloch, David R. McKenzie, Hiep N. Tran, and Jim G. Partridge. "Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces." IEEE Transactions on Electron Devices 68, no. 2 (2021): 720. https://doi.org/10.1109/TED.2020.3044021.

MLA (9th ed.) Citation

Le, Phuong Y., et al. "Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces." IEEE Transactions on Electron Devices, vol. 68, no. 2, 2021, p. 720, https://doi.org/10.1109/TED.2020.3044021.