Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces.
Saved in:
| Title: | Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces. |
|---|---|
| Authors: | Le, Phuong Y.1, phuong.leyen@rmit.edu.au, Gazzana, Amanda1, s3721457@student.rmit.edu.au, Murdoch, Billy J.2, billy.murdoch@rmit.edu.au, McCulloch, Dougal G.3, david.mckenzie@sydney.edu.au, McKenzie, David R.1, dougal.mcculloch@rmit.edu.au, Tran, Hiep N.4, hiep.tranlengoc@rmit.edu.au, Partridge, Jim G.1, james.partridge@rmit.edu.au |
| Source: | IEEE Transactions on Electron Devices; Feb2021, Vol. 68 Issue 2, p720-725, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 148353534 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Le%2C+Phuong+Y%2E%22">Le, Phuong Y.</searchLink><relatesTo>1</relatesTo>, <i>phuong.leyen@rmit.edu.au</i><br /><searchLink fieldCode="AU" term="%22Gazzana%2C+Amanda%22">Gazzana, Amanda</searchLink><relatesTo>1</relatesTo>, <i>s3721457@student.rmit.edu.au</i><br /><searchLink fieldCode="AU" term="%22Murdoch%2C+Billy+J%2E%22">Murdoch, Billy J.</searchLink><relatesTo>2</relatesTo>, <i>billy.murdoch@rmit.edu.au</i><br /><searchLink fieldCode="AU" term="%22McCulloch%2C+Dougal+G%2E%22">McCulloch, Dougal G.</searchLink><relatesTo>3</relatesTo>, <i>david.mckenzie@sydney.edu.au</i><br /><searchLink fieldCode="AU" term="%22McKenzie%2C+David+R%2E%22">McKenzie, David R.</searchLink><relatesTo>1</relatesTo>, <i>dougal.mcculloch@rmit.edu.au</i><br /><searchLink fieldCode="AU" term="%22Tran%2C+Hiep+N%2E%22">Tran, Hiep N.</searchLink><relatesTo>4</relatesTo>, <i>hiep.tranlengoc@rmit.edu.au</i><br /><searchLink fieldCode="AU" term="%22Partridge%2C+Jim+G%2E%22">Partridge, Jim G.</searchLink><relatesTo>1</relatesTo>, <i>james.partridge@rmit.edu.au</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>; Feb2021, Vol. 68 Issue 2, p720-725, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=148353534 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TED.2020.3044021 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 720 Titles: – TitleFull: Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Le, Phuong Y. – PersonEntity: Name: NameFull: Gazzana, Amanda – PersonEntity: Name: NameFull: Murdoch, Billy J. – PersonEntity: Name: NameFull: McCulloch, Dougal G. – PersonEntity: Name: NameFull: McKenzie, David R. – PersonEntity: Name: NameFull: Tran, Hiep N. – PersonEntity: Name: NameFull: Partridge, Jim G. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: Feb2021 Type: published Y: 2021 Identifiers: – Type: issn-print Value: 00189383 Numbering: – Type: volume Value: 68 – Type: issue Value: 2 Titles: – TitleFull: IEEE Transactions on Electron Devices Type: main |
| ResultId | 1 |
