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Path delay test generation at functional level.

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Bibliographic Details
Title: Path delay test generation at functional level.
Authors: Bareisa, Eduardas1, Jusas, Vacius1, vacius.jusas@ktu.lt, Motiejunas, Kestutis1, Seinauskas, Rimantas1
Source: IET Computers & Digital Techniques (Wiley-Blackwell); May2015, Vol. 9 Issue 3, p135-141, 7p
Database: Applied Science & Technology Source
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