Effect and extraction of series resistance in Al2O3‐InGaAs MOS with bulk‐oxide trap.
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| Title: | Effect and extraction of series resistance in Al2O3‐InGaAs MOS with bulk‐oxide trap. |
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| Authors: | Yu, B.1, Yuan, Y.1, Chen, H.‐P.1, Ahn, J.2, McIntyre, P.C.2, Taur, Y.1, ytaur@eng.ucsd.edu |
| Source: | Electronics Letters (Wiley-Blackwell); Mar2013, Vol. 49 Issue 6, p492-493, 2p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00135194 |
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| DOI: | 10.1049/el.2013.0433 |
