APA (7th ed.) Citation

Yu, B., Yuan, Y., Chen, H., Ahn, J., McIntyre, P., & Taur, Y. (2013). Effect and extraction of series resistance in Al2O3‐InGaAs MOS with bulk‐oxide trap. Electronics Letters (Wiley-Blackwell), 49(6), 492. https://doi.org/10.1049/el.2013.0433

Chicago Style (17th ed.) Citation

Yu, B., Y. Yuan, H.‐P Chen, J. Ahn, P.C McIntyre, and Y. Taur. "Effect and Extraction of Series Resistance in Al2O3‐InGaAs MOS with Bulk‐oxide Trap." Electronics Letters (Wiley-Blackwell) 49, no. 6 (2013): 492. https://doi.org/10.1049/el.2013.0433.

MLA (9th ed.) Citation

Yu, B., et al. "Effect and Extraction of Series Resistance in Al2O3‐InGaAs MOS with Bulk‐oxide Trap." Electronics Letters (Wiley-Blackwell), vol. 49, no. 6, 2013, p. 492, https://doi.org/10.1049/el.2013.0433.