Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor.
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| Title: | Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor. |
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| Authors: | Fujii, Saya1, Kano, Jun1, kano-j@cc.okayama-u.ac.jp, Oshime, Norihiro2, Higuchi, Tohru3, Nishina, Yuta1,4, Fujii, Tatsuo1, Ikeda, Naoshi1, Ota, Hiromi5 |
| Source: | Journal of Applied Physics; 2/28/2021, Vol. 129 Issue 8, p1-7, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/5.0033761 |
