Degradation Analysis of Thin Mg-xAg Wires Using X-ray Near-Field Holotomography.
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| Title: | Degradation Analysis of Thin Mg-xAg Wires Using X-ray Near-Field Holotomography. |
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| Authors: | Meyer, Sebastian1, sebastian.meyer@hereon.de, Wolf, Andreas1, andreas.wolf@hereon.de, Sanders, Daniela1, daniela.sanders@hzg.de, Iskhakova, Kamila1, kamila.iskhakova@hereon.de, Ćwieka, Hanna1, hanna.slominska@hereon.de, Bruns, Stefan1, stefan.bruns@hereon.de, Flenner, Silja2, Silja.flenner@hereon.de, Greving, Imke2, Imke.Greving@hereon.de, Hagemann, Johannes3,4, johannes.hagemann@desy.de, Willumeit-Römer, Regine1, Regine.Willumeit@hereon.de, Wiese, Björn1, bjoern.wiese@hereon.de, Zeller-Plumhoff, Berit1, bjoern.wiese@hereon.de |
| Source: | Metals (2075-4701); Sep2021, Vol. 11 Issue 9, p1422, 1p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 20754701 |
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| DOI: | 10.3390/met11091422 |
