Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells.
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| Title: | Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells. |
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| Authors: | Kang, Dongkyun1, Park, HyunJung1, Choi, Dongjin1, Han, Hyebin1, Seol, Jaeseung2, Kang, Yoonmook1,3, ddang@korea.ac.kr, Lee, Hae-Seok3, Kim, Donghwan1, donghwan@korea.ac.kr |
| Source: | Solar Energy; Feb2022, Vol. 233, p111-117, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0038092X |
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| DOI: | 10.1016/j.solener.2022.01.003 |
