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Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells.

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Title: Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells.
Authors: Kang, Dongkyun1, Park, HyunJung1, Choi, Dongjin1, Han, Hyebin1, Seol, Jaeseung2, Kang, Yoonmook1,3, ddang@korea.ac.kr, Lee, Hae-Seok3, Kim, Donghwan1, donghwan@korea.ac.kr
Source: Solar Energy; Feb2022, Vol. 233, p111-117, 7p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 155103700
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Label: Title
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  Data: Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells.
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  Data: <searchLink fieldCode="AU" term="%22Kang%2C+Dongkyun%22">Kang, Dongkyun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Park%2C+HyunJung%22">Park, HyunJung</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Choi%2C+Dongjin%22">Choi, Dongjin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Han%2C+Hyebin%22">Han, Hyebin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Seol%2C+Jaeseung%22">Seol, Jaeseung</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kang%2C+Yoonmook%22">Kang, Yoonmook</searchLink><relatesTo>1,3</relatesTo>, <i>ddang@korea.ac.kr</i><br /><searchLink fieldCode="AU" term="%22Lee%2C+Hae-Seok%22">Lee, Hae-Seok</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Donghwan%22">Kim, Donghwan</searchLink><relatesTo>1</relatesTo>, <i>donghwan@korea.ac.kr</i>
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  Data: <searchLink fieldCode="JN" term="%22Solar+Energy%22">Solar Energy</searchLink>; Feb2022, Vol. 233, p111-117, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=155103700
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.solener.2022.01.003
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 111
    Titles:
      – TitleFull: Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Kang, Dongkyun
      – PersonEntity:
          Name:
            NameFull: Park, HyunJung
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            NameFull: Choi, Dongjin
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            NameFull: Han, Hyebin
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            NameFull: Seol, Jaeseung
      – PersonEntity:
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            NameFull: Kang, Yoonmook
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            NameFull: Lee, Hae-Seok
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            NameFull: Kim, Donghwan
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          Dates:
            – D: 01
              M: 02
              Text: Feb2022
              Type: published
              Y: 2022
          Identifiers:
            – Type: issn-print
              Value: 0038092X
          Numbering:
            – Type: volume
              Value: 233
          Titles:
            – TitleFull: Solar Energy
              Type: main
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