The Effect of Bit Depth on High-Temperature Digital Image Correlation Measurements.
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| Title: | The Effect of Bit Depth on High-Temperature Digital Image Correlation Measurements. |
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| Authors: | Jarrett, Steven R.1, Thai, Thinh Q.2, Rowley, Lindsey J.1, Craig, Weston D.1, Berke, Ryan B.1 |
| Source: | Journal of Sensors; 6/2/2022, p1-19, 19p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 1687725X |
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| DOI: | 10.1155/2022/6554128 |