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The Effect of Bit Depth on High-Temperature Digital Image Correlation Measurements.

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Title: The Effect of Bit Depth on High-Temperature Digital Image Correlation Measurements.
Authors: Jarrett, Steven R.1, Thai, Thinh Q.2, Rowley, Lindsey J.1, Craig, Weston D.1, Berke, Ryan B.1
Source: Journal of Sensors; 6/2/2022, p1-19, 19p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 157216680
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: The Effect of Bit Depth on High-Temperature Digital Image Correlation Measurements.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Jarrett%2C+Steven+R%2E%22">Jarrett, Steven R.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Thai%2C+Thinh+Q%2E%22">Thai, Thinh Q.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Rowley%2C+Lindsey+J%2E%22">Rowley, Lindsey J.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Craig%2C+Weston+D%2E%22">Craig, Weston D.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Berke%2C+Ryan+B%2E%22">Berke, Ryan B.</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Sensors%22">Journal of Sensors</searchLink>; 6/2/2022, p1-19, 19p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=157216680
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1155/2022/6554128
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 19
        StartPage: 1
    Titles:
      – TitleFull: The Effect of Bit Depth on High-Temperature Digital Image Correlation Measurements.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Jarrett, Steven R.
      – PersonEntity:
          Name:
            NameFull: Thai, Thinh Q.
      – PersonEntity:
          Name:
            NameFull: Rowley, Lindsey J.
      – PersonEntity:
          Name:
            NameFull: Craig, Weston D.
      – PersonEntity:
          Name:
            NameFull: Berke, Ryan B.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 02
              M: 06
              Text: 6/2/2022
              Type: published
              Y: 2022
          Identifiers:
            – Type: issn-print
              Value: 1687725X
          Titles:
            – TitleFull: Journal of Sensors
              Type: main
ResultId 1